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InControl Engineering
HOME
PRODUCTS
  • Smart Sensors
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  • Run-To-Run Controls
INDUSTRIES
  • Commercial HVAC
  • Semiconductor
COMPANY
  • Our Story
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CONTACT
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More
  • HOME
  • PRODUCTS
    • Smart Sensors
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    • Run-To-Run Controls
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  • HOME
  • PRODUCTS
    • Smart Sensors
    • Equipment Controls
    • Run-To-Run Controls
  • INDUSTRIES
    • Commercial HVAC
    • Semiconductor
  • COMPANY
    • Our Story
    • Partners
    • Sustainability
    • Endorsements
    • Newsroom
  • CONTACT
    • Corporate Headquarters
    • North America
    • Europe
    • Asia
    • Middle East
    • Africa

SEMICONDUCTOR MANUFACTURING

The semiconductor industry is rapidly evolving as device geometries shrink year after year. This trend drives the need for more advanced process control solutions to improve manufacturing efficiency, reduce costs, and maintain product quality. These solutions utilize sensors, analytics, and machine learning algorithms to monitor and optimize manufacturing processes in real-time as well as quickly identify process variations to take corrective action before experiencing wafer defects or scrap.

Benefits

SCRAP PREVENTION

Predict equipment failures to eliminate costly wafer scrap or rework by no longer running to fail.

PREDICTIVE MAINTENANCE

Make run to fail maintenance practices a thing of the past by implementing condition based monitoring of your equipment.   Empower your maintenance personnel to proactively take action prior to a catastrophic equipment failure to avoid costly downtime and repairs.

MEAN TIME TO REPAIR (MTTR)

Utilize failure analysis and classification to quickly diagnose the root cause of equipment and process issues to return your equipment back into production faster than ever before.  

COST OF OWNERSHIP (COO)

Optimize your maintenance schedules to reduce costs associated with unnecessary maintenance activities.  Exchange parts and consumables based on their actual  condition rather than relying on antiquated and costly preventive maintenance practices.

EQUIPMENT UPTIME

Improve equipment uptime using a combination of proactive maintenance strategies, such as predictive maintenance and equipment maintenance schedule optimization helps ensure that all maintenance activities are performed at the most opportune times to minimize downtime.   Enhance your existing equipment with more advanced control technologies to eliminate periodic control system maintenance required by antiquated control systems.

PROCESS CAPABILITY

Enhance equipment controller capabilities to achieve tighter process specifications without buying new equipment.

WAFER THROUGHPUT

More precise control of critical control variables reduces stabilization phases of your process allowing you to push more wafers through your equipment.

DEVICE YIELD

Utilize equipment controller enhancements and run-to-run process control systems to improve manufacturing quality and increase device yield. 

TURN KEY SOLUTION

Our products are not do-it-yourself tool kits or projects.  Immediately benefit from our extensive domain knowledge and experience in semiconductor manufacturing to solve any problem you might be facing.

FACTORY SOFTWARE INTEGRATION

Quickly and easily integrate smart sensor data into any Manufacturing Execution System (MES), Fault Detection and Classification (FDC) system, Advanced Process Control (APC) system, or Statistical Process Control (SPC) system using a variety of communication protocols.

SECS/GEM

EDA-INTERFACE A

SECS/GEM

SEMI Equipment Communications Standard (SECS) and Generic Equipment Model (GEM) are protocols utilized for equipment-to-host data communications in the semiconductor industry.

REST-API

EDA-INTERFACE A

SECS/GEM

Representational State Transfer Application Programming Interface (REST API) is a widely used communication interface for web-based software applications.  It allows different software applications to communicate with each other by exchanging data over a standard protocol, enabling fast and efficient software development and integration.

EDA-INTERFACE A

EDA-INTERFACE A

EDA-INTERFACE A

SEMI Standard Equipment Data Acquisition (EDA) Interface-A is a data acquisition protocol utilized in the semiconductor industry.  It is a self-defining data subscription protocol providing one-way communication to any software application.

FRONT END MANUFACTURING APPLICATIONS

DIFFUSION HEATING ELEMENTS

DIFFUSION HEATING ELEMENTS

DIFFUSION HEATING ELEMENTS

 Resistance monitoring to prevent wafer scrap and equipment downtime. Model Based Temperature Control (MBTC) retrofits to improve process capability and eliminate real-time and offline profiling. Heating Element Life Optimization (HELO) controllers increase element lifetime.

BOAT LOADERS AND ELEVATORS

DIFFUSION HEATING ELEMENTS

DIFFUSION HEATING ELEMENTS

Vibration monitoring of linear actuators and drives  to predict mechanical failure, particle contamination, and wafer load/unload errors.

DRY VACUUM PUMPS

DIFFUSION HEATING ELEMENTS

CHEMICAL MECHANICAL POLISHING

 Vibration monitoring to detect mechanical wear and failure of motors, gearbox, lobes, screws, and casings to prevent wafer scrap, minimize rebuild costs, and validate incoming rebuild quality.

CHEMICAL MECHANICAL POLISHING

CHEMICAL MECHANICAL POLISHING

CHEMICAL MECHANICAL POLISHING

  Vibration monitoring of polishing heads, platens, and pad conditioning arms to monitor mechanical wear and failure as well as detect wafer scratching and breakage. Real-time pad conditioner downforce monitoring to improve polishing repeatability.

BOAT ROTATION UNITS

CHEMICAL MECHANICAL POLISHING

BOAT ROTATION UNITS

 Vibration monitoring of ferrofluid seal, motor and mechanical linkage to prevent particle contamination and wafer scrap  

DC POWER SUPPLIES

CHEMICAL MECHANICAL POLISHING

BOAT ROTATION UNITS

Voltage monitoring and redundancy protection for power supplies to reduce scrap and downtime as well as improve your mean time to repair.

CABINET EHXAUST

BAROMETRIC PRESSURE

CABINET EHXAUST

 Current or vibration monitoring of bearings and motors of the exhaust fans to prevent electronic component overheating and failure.

LEAKS

BAROMETRIC PRESSURE

CABINET EHXAUST

Detect water and chemical leaks underneath equipment before it becomes a safety hazard or damages your equipment.

BAROMETRIC PRESSURE

BAROMETRIC PRESSURE

BAROMETRIC PRESSURE

 Automated adjustment of process recipe parameters in atmospheric processes to compensate for barometric pressure disturbances improving  process run-to-run repeatability.

EXHAUST LINES

HEATER BLOCKS AND PEDESTALS

EXHAUST LINES

 Pressure monitoring of exhaust draw to detect clogging in the lines or  abatement system to prevent wafer scrap and equipment downtime 

HALOGEN LAMPS

HEATER BLOCKS AND PEDESTALS

EXHAUST LINES

 Resistance and light intensity monitoring to process uniformity variation and wafer scrap.

HEATER BLOCKS AND PEDESTALS

HEATER BLOCKS AND PEDESTALS

HEATER BLOCKS AND PEDESTALS

 Resistance monitoring to prevent wafer scrap and reduce equipment downtime 

IMMERSION HEATERS

MASS FLOW CONTROLLERS

HEATER BLOCKS AND PEDESTALS

 Resistance monitoring to prevent wafer scrap and reduce equipment downtime 

MASS FLOW CONTROLLERS

MASS FLOW CONTROLLERS

MASS FLOW CONTROLLERS

 Gas flow monitoring to ensure MFC integrity to reduce wafer scrap and process drift 

PNEUMATIC PUMPS

MASS FLOW CONTROLLERS

MASS FLOW CONTROLLERS

 Vibration based stroke monitoring of diaphragm and bellows pumps detects filter clogging and mechanical failure.  Real-time pneumatic pressure measurement detects air leaks in pneumatic tubing, shuttle valves, manifolds, and compression fittings.

TURBO PUMPS

WAFER SCRATCHING AND BREAKAGE

WAFER HANDLING ROBOTS

Vibration monitoring to prevent wafer scrap and process tool damage as well as reduce rebuild costs

WAFER HANDLING ROBOTS

WAFER SCRATCHING AND BREAKAGE

WAFER HANDLING ROBOTS

 Vibration monitoring to detect component degradation and calibration drift of the robot to prevent wafer scrap and equipment downtime 

WAFER SCRATCHING AND BREAKAGE

WAFER SCRATCHING AND BREAKAGE

WAFER SCRATCHING AND BREAKAGE

 Vibration monitoring to detect misalignment of the automation resulting in wafer scratching or breakage 

FACILITIES APPLICATIONS

WATER CHILLERS

AIR COMPRESSORS

AIR COMPRESSORS

   Vibration monitoring of compressors, chilled water pumps, and condenser water pumps to predict mechanical wear and failure of motors, gears, bearings, and impellers.  In situ monitoring of water quality,  temperature, pressure, flow, and leaks as well as refrigerant charge and leaks. 

AIR COMPRESSORS

AIR COMPRESSORS

AIR COMPRESSORS

 Vibration monitoring to predict mechanical wear and failure of motors, gears, bearings, and other surfaces. In situ monitoring of oil quality, temperature, and pressure.

CENTRAL VACUUM

AIR COMPRESSORS

CENTRAL VACUUM

Vibration monitoring to detect mechanical wear and failure of motors, gearbox, lobes, screws, and casings. In situ monitoring of oil quality, temperature, and pressure.

PUMPS

CLEANROOM HVAC

CENTRAL VACUUM

 Vibration monitoring of  water pumps (chilled, condenser, deionized, and reverse osmosis) as well as chemical pumps to predict mechanical wear and failure of motors, bearings, couplings, and impellers. In situ monitoring of media quality,  temperature, pressure, flow, and leaks. 

ABATEMENT

CLEANROOM HVAC

CLEANROOM HVAC

  Vibration monitoring of  water pumps and air handlers to predict mechanical wear and failure of motors, gears, bearings, couplings, and impellers. In situ monitoring of temperature, pressure, flow, and leaks. 

CLEANROOM HVAC

CLEANROOM HVAC

CLEANROOM HVAC

 Vibration monitoring of air handlers, chillers, cooling towers, and water pumps to detect mechanical wear and failure.  HEPA filter differential pressure monitoring for condition based exchange. Resistance monitoring of electric heaters to predict failures. Localized air quality monitoring for particle source detection.

PIPE LEAKS

PIPE LEAKS

PIPE LEAKS

Detect water and chemical leaks along pipes before it becomes a safety hazard or damages your facility.

CUSTOMERS

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